CEMS 215: Microscopy and Microstructural Characterization

Department
School
Inamori School of Engineering
Credits 3
This course introduces optical, electron, and scanning probe microscopy techniques used to characterize the microstructure of materials. Lectures focus on the fundamental physical/chemical phenomena associated with the various techniques, their practical application, and the interpretation of the resultant data. Capabilities and limitations of these techniques are discussed. Laboratory exercises consist of the preparation and hands-on characterization of a variety of materials via both optical and electron microscope techniques.
Prerequisites
Corequisites